Perspective solutions for AFM probes Further development of the polysilicon technology in the field of AFM probes: • tip-to-base ratio reduction • base diameter reduction • ultra-long tips production • new ultra-sharp AFM probes line production • different coating materials combining Ostec has the following metal targets: Ni, Со, Мо, Сг, V, Pt, Au, Аl, Сu, Та, Re, Fe, С, Ag, W, Ti- In2O3, SiO2, BeO, W2C Alloy targets: NiFe (80/20), CoCr (50/50), FeCo (50/50), AlSi Composite targets: Me-C, Me-Au-Ag, Me-Pt, Me-Cr, etc. Ostec offers unique and ambitious solutions in the field of TERS AFM probes: • construction of nanoantennas for effective plasmon excitation • modification of the antenna cross section • implementation of periodic resonant structures with variable periods • variable tilt angle for enhanced plasmon excitation Ostec offers full set of calibration standards for SPM lateral and vertical calibration; lateral non-linearity, hysteresis, creep, and cross-coupling effects detection; tip shape determination. Ostec brand new technology combines all critical advantages in one chip: • Sharp tip (curvature radius <10 nm) • Resonance frequency with high accuracy (±10%) • Special chip geometry for convenient operation • High aspect ratio tip • Enhanced cantilever back-side reflection ETALON Series probes have two polysilicon levers with a pedestal and monocrystal silicon tips. Precision technology of polysilicon deposition guarantees the lever thickness control. Special frequency stabilizer is designed to make the resonant frequency and force constant dispersion smaller (due to the lever length control).

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