The technologies underlying NIOS nanomechanical instruments have been developed by russian materials scientists and engineers since 1995. All technical solutions employed on NIOS instruments are protected by patents under Russian Federation. The modular design of NIOS series allows end-users to configure a nanomechanical tester specifically for their needs and requirements. Configurations of NIOS nanomechanical tester can consist of the following modules: - Wide-range nanoindenter - Optical Microscope - Atomic Force Microscope - Scanning nanomechanical tester - Electrical Properties Measurement - Lateral Force Sensor - In-situ Topography Imaging - Heating Stage NIOS Advanced is the flagship model which implements more than 30 different measuring techniques covering all types of physical and mechanical properties measurements at the submicron and nanometer scale. With NIOS control software a high degree of automated measurements can be achieved allowing the end-user to configure any set of measurements recipes to be performed without operator intervention. This feature is particularly useful for the technical control of the materials quality. With this added functionality, NIOS can be used for research work as well as for industrial applications. Mechanical properties: -Instrumented indentation in accordance with ISO14577 -Vickers microhardness measurements -Sclerometry tests (hardness measurement by scratching) with constant or variable load -Force spectroscopy -Mechanical nanolithography -Beams and membranes stiffness measurements -Hardness and elastic modulus dependency of the indentation depth -Automated mapping of two- and three-dimensional hardness and elastic modulus distribution over the surface within the area of 50x50 mm -Adhesion characterisation by the scratch test -Measurements in liquids

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