High Performance AFM/MFM hpAFM is the most advanced atomic force microscope that brings a new level of performance, functionality, design and capability. It’s designed to minimize the time to get best results. Whether you can work in liquid or in air conditions, it is for everyone from material science to life science. hpAFM offers excellent features such as alignment-free design, closed loop flexure scanner, decoupled z scanner, 10 MP video microscope and flexible operating modes. High Perfromance Atomic Force Microscope hpAFM Low noise beam deflection method with RF Modulated 635nm Laser source Position sensitive quadrant photo detector optimized for laser wavelength. 25 fm/Hz½ (max.) noise floor 24 bit 100x100x12 μm XYZ scanner for large area scan Cross-talk eliminated XY, Z flexure stage with closed loop capacitance sensor Highest resolution with open loop and closed loop Modular, flexible design to include optional modes. Alignment free design Standard Microscopy Modes Contact mode Non-Contact mode by Phase Locked Loop System (PLL) Dynamic Force / Intermittent Contact / Tapping Mode Lateral Force Microscopy (LFM) Phase Imaging Magnetic Force Microscopy (MFM) (<14 nm magnetic resolution with super sharp cantilevers) Electostatic Force Microscopy (EFM) f-d Spectroscopy) Nanolithography Extended Microscopy Modes Scanning Tunneling Microscopy (STM) Piezoresponse Force Microscopy (PRFM) Kelvin Probe Force Microscopy (KPFM) Adhesion Force Imaging Nanoindentation and Scratch Testing Scanning Capacitance Microscopy (SCM) Electrochemical AFM (EC-AFM) I-V Curves and Spectroscopy with STM Module Viscoelasticity Measurements Nanomechanical Imaging Mode Scanning Spreading Resistance Microscopy (SSRM) Conductive AFM Closed Liquid Cell

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